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IEEE Transactions on Electron Devices
ISSN
P 0018-9383 E 1557-9646
출판사
Institute of Electrical and Electronics Engineers
국가
USA
발행 상태
활성
데이터베이스 수록 정보
CiteScore 2011-2025 (15년)
JCR 1997-2025 (29년)
SCI 2010-2019 (10년)
SCIE 2010-2026 (17년)
Scopus 1963-2026 (64년)
SJR 1999-2020, 2022-2025 (26년)
전체 6건 중 1번부터 6번까지의 결과를 표시합니다.
2026
Article
Depletion-Mode a-IGZO TFT Scan Driver With a Single Negative Power Source for Low-Power AMOLED Displays
- Kim, Dongseok ;
- Kim, Hyunwoo ;
- Moon, Jinho ;
- Lee, Hojin
- 2026-08
- IEEE Journal of the Electron Devices Society
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Article
Geometric and Area Scaling Effects on Ferroelectric Properties of Al0.8Sc0.2N-Based Capacitive Memory
- Lim, Yoojin ;
- Joo, Hyeong Jun ;
- Yoon, Sisung ;
- Yoo, Geonwook
- 2026-04
- IEEE Journal of the Electron Devices Society
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2021
Article
Graded Crystalline HfO2 Gate Dielectric Layer for High-k/Ge MOS Gate Stack
- Lee, C.H. ;
- Yang, J.Y. ;
- Heo, J. ;
- Yoo, G.
- 2021-02
- IEEE Journal of the Electron Devices Society
- Institute of Electrical and Electronics Engineers Inc.
2019
Article
Effect of Al 2 O 3 Passivation on Electrical Properties of beta -Ga 2 O 3 Field-Effect Transistor
- Ma, J. ;
- Lee, O.J. ;
- Yoo, G.
- 2019-04
- IEEE Journal of the Electron Devices Society
- Institute of Electrical and Electronics Engineers Inc.
2018
Article
Abnormal Bias-Temperature Stress and Thermal Instability of beta-Ga2O3 Nanomembrane field-Effect Transistor
- Ma, Jiyeon ;
- Lee, Oukjae ;
- Yoo, Geonwook
- 2018-09
- IEEE Journal of the Electron Devices Society
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
2017
Article
High Resolution a-IGZO TFT Pixel Circuit for Compensating Threshold Voltage Shifts and OLED Degradations
- Kim, Daejung ;
- Kim, Yongchan ;
- Lee, Suwon ;
- Kang, Moon Sung ;
- Kim, Do Hwan ;
- ... Lee, Hojin
- 2017-09
- IEEE Journal of the Electron Devices Society
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC