Ferroelectric AlScN Field-Plated Vertical β-Ga2O3 SBD With Improved On-Resistance and Breakdown Voltage

  • Yoon, Sisung; 
  • Kim, Hyojung; 
  • Lim, Yoojin; 
  • Oh, Seungyoon; 
  • Park, Jongmin; 
  • ... Yoo, Geonwook
Citations

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초록

We report a vertical beta -Ga2O3 Schottky barrier diode (SBD) enhanced with a ferroelectric aluminum scandium nitride (AlScN) field plate (FP). The FP SBD exhibits a reduced on-resistance ( R-on) of 2.88-5.08 m Omega & sdot; cm(2) and a breakdown voltage (BV) of 635-865 V, which is approximately 3.5 & times; higher than BV of the reference SBD ( R-on : 3.16-6.15 m Omega & sdot;cm(2); BV: 210-243 V). Additionally, we showed that performance can be further improved by FP SBD that incorporates a 4-nm HfO2 interlayer (IL) FP SBD, achieving R-on of 3.07-5.59 m Omega & sdot; cm(2) and a BV of 1115-1155 V. Electrical performance is assessed up to 550 K, while structural analysis confirms the first direct deposition of reactive sputtered ferroelectric AlScN on the beta -Ga2O3 epilayer. TCAD simulations verify the polarization field effect in these gains and also validate the electric field dispersion effect with increasing AlScN thickness. Consequently, the FP SBD delivered a significant improvement ( > 10 & times;) , and the ILFP SBD delivered an improvement of ( > 20 & times;) in Baliga's figure of merits (BFOMs), highlighting its potential to advance Ga2O3-based power devices ' performance.

키워드

Electric fields; Hafnium compounds; Anodes; X-ray scattering; Temperature measurement; Current density; Substrates; Pulse measurements; Electric breakdown; Capacitors; Aluminum scandium nitride (AlScN); ferroelectric; field plate (FP); gallium oxide; Schottky barrier diode (SBD); SCHOTTKY-BARRIER DIODES; EDGE TERMINATION
제목
Ferroelectric AlScN Field-Plated Vertical β-Ga2O3 SBD With Improved On-Resistance and Breakdown Voltage
저자
Yoon, Sisung; Kim, Hyojung; Lim, Yoojin; Oh, Seungyoon; Park, Jongmin; Yoo, Geonwook
DOI
10.1109/TED.2026.3659117
발행일
2026-03
유형
Article
저널명
IEEE Transactions on Electron Devices
권
73
호
3
페이지
1279 ~ 1284