A Compact Power-on-Reset Circuit With Configurable Brown-Out Detection

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초록

A compact power-on-reset (POR) circuit with a configurable brown-out reset (BOR) function is presented. An integrated voltage reference (VR) circuit provides a constant bias voltage that facilitates voltage-triggered POR/BOR operation, reliably preventing POR signal generation when the ramping supply voltage (V-DD) level is too low. Moreover, the proposed POR circuit features a fast, configurable POR/BOR operation owing to an inverter-based trip point detector (TPD), which triggers the reset signal with a programmable trip point. The prototype POR circuit achieves a POR level higher than 752 mV with a maximum POR delay of 16.4 mu s at a 0.8-1.2-V V-DD , supporting a wide range of supply ramping time from 1 mu s to 1 s. In addition, the prototype detects brown-out events with a supply drop of 0.1-0.4 V, generating the BOR signal. Designed using a 28-nm CMOS process, the prototype has a compact active area of 995.3 mu m(2) and a quiescent current of 162-974 nA at a 1-V V-DD .

키워드

Brown-out reset (BOR)DRAMpower-on-reset (POR)voltage reference (VR)
제목
A Compact Power-on-Reset Circuit With Configurable Brown-Out Detection
저자
Kim, YoochangPark, Jun-EunPark, KwanseoHwang, Young-Ha
DOI
10.1109/TVLSI.2025.3561131
발행일
2025-07
유형
Article
저널명
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
33
7
페이지
2074 ~ 2078