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A Compact Power-on-Reset Circuit With Configurable Brown-Out Detection
- Kim, Yoochang;
- Park, Jun-Eun;
- Park, Kwanseo;
- Hwang, Young-Ha
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0초록
A compact power-on-reset (POR) circuit with a configurable brown-out reset (BOR) function is presented. An integrated voltage reference (VR) circuit provides a constant bias voltage that facilitates voltage-triggered POR/BOR operation, reliably preventing POR signal generation when the ramping supply voltage (V-DD) level is too low. Moreover, the proposed POR circuit features a fast, configurable POR/BOR operation owing to an inverter-based trip point detector (TPD), which triggers the reset signal with a programmable trip point. The prototype POR circuit achieves a POR level higher than 752 mV with a maximum POR delay of 16.4 mu s at a 0.8-1.2-V V-DD , supporting a wide range of supply ramping time from 1 mu s to 1 s. In addition, the prototype detects brown-out events with a supply drop of 0.1-0.4 V, generating the BOR signal. Designed using a 28-nm CMOS process, the prototype has a compact active area of 995.3 mu m(2) and a quiescent current of 162-974 nA at a 1-V V-DD .
키워드
- 제목
- A Compact Power-on-Reset Circuit With Configurable Brown-Out Detection
- 저자
- Kim, Yoochang; Park, Jun-Eun; Park, Kwanseo; Hwang, Young-Ha
- 발행일
- 2025-07
- 유형
- Article
- 권
- 33
- 호
- 7
- 페이지
- 2074 ~ 2078