Effects of Ag addition and Ag3Sn formation on the mechanical reliability of Ni/Sn solder joints

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초록

Formation of intermetallic compounds (IMCs) in solder joints is closely associated with the mechanical reliability of the system. Though internal voids formed in Ni/Sn solder joints are known to be related to the formation of Ni3Sn4IMC, a detailed study on the mechanical reliability has not yet been reported. In this study, the mechanical reliability of Ni/Sn joints was investigated using two different soldering systems: Ni/Ag-Ag/Sn/Ni bilayers and Ni/Sn/Ag-Ag/Sn/Ni sandwich structures. The failure mode was found to be closely related to the formation and growth of an Ag3Sn phase. Filling of the voids with Ag3Sn IMC resulted in maximum shear strength, with a failure locus through Ni3Sn4 and Ag3Sn. However, formation of a large amount of Ag3Sn decreased the shear strength once again. (C) 2017 Elsevier Ltd. All rights reserved.

키워드

Microelectronics packaging; Intermetallic compound; Void formation; Mechanical reliability; LEAD-FREE SOLDERS; SN-PB SOLDER; INTERFACIAL REACTION; PLATE FORMATION; INTERMETALLIC COMPOUND; CU/NI/PD METALLIZATION; CU; SOLIDIFICATION; KINETICS; GROWTH
제목
Effects of Ag addition and Ag3Sn formation on the mechanical reliability of Ni/Sn solder joints
저자
Chu, Kunmo; Lee, Changseung; Park, Sung-Hoon; Sohn, Yoonchul
DOI
10.1016/j.microrel.2017.06.012
발행일
2017-08
유형
Article
저널명
Microelectronics and Reliability
권
75
페이지
53 ~ 58