Effects of carbon contaminations on Y2O3-stabilized ZrO2 thin film electrolyte prepared by atomic layer deposition for thin film solid oxide fuel cells

  • 박태현; 
  • 차석원; 
  • 조구영; 
  • 이예근; 
  • 김유성; 
  • 외 1명
Citations

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17
Citations

SCOPUS

21

초록

In this study, influence of carbon impurities on characteristics of ALD-YSZ films is systematically investigated. Carbon concentration in ALD-YSZ films was controlled by changing Y2O3 ratio in YSZ super cycle. To examine electrochemical characteristics of ALD-YSZ films, nano-porous templates based thin film solid oxide fuel cells (TF-SOFCs) were fabricated with ALD-YSZ thin film electrolyte and examined at 500 degrees C. Open circuit voltages (OCVs) of TF-SOFCs with ALD-YSZ were clearly dependent on carbon contaminations. High carbon concentration caused leakage current through internal short circuit, and then, OCVs of TF-SOFCs were decreased. Post-processing of ALD-YSZ thin film electrolyte improved OCVs of TF-SOFCs. (C) 2016 CIRP.

제목
Effects of carbon contaminations on Y2O3-stabilized ZrO2 thin film electrolyte prepared by atomic layer deposition for thin film solid oxide fuel cells
저자
박태현; 차석원; 조구영; 이예근; 김유성; 이장무
DOI
10.1016/j.cirp.2016.04.079
발행일
2016-06
유형
Article
저널명
CIRP Annals - Manufacturing Technology
권
65
호
1
페이지
515 ~ 518