Tests and measurements of electrical and optical characteristics for CMOS image sensors

초록

CMOS image sensor often shows defects or failures on electrical and optical characteristics. These defects and failures should be detected before CMOS image sensor is installed on digital imaging equipment. This paper explains on how to test and measure the electrical and optical characteristics of CMOS image sensors. It also explains the standardized process to check these defects or failures. These standardized guidelines are very helpful and effective in the tests and measurements of CMOS image sensors, and it will contribute to semiconductor, image sensor, and digital imaging equipment industry significantly.