A programmable memory bist for embedded memory

초록

Recent development in System-on-Chip(SOC) makes it possible to incorporate large embedded into a chip. However, it also complicates the test , since usually the embedded memories cannot be from the external environment. Thus, the proposed supports the various memory test algorithms to test types of memory modules in SOC. Moreover, it is able At-speed test in a memory module. Consequently, the is more efficient in terms of test cost. ©2008 IEEE.