자동차 반도체의 신뢰성 테스트 표준: AEC-Q100

초록

This paper describes acceleration tests for reliability of semiconductors. It also describes AEC-Q100, international teststandard for reliability of automotive semiconductors. Semiconductors can be used for dozens of years. So accelerationtests are essential to test potential problems over whole period of product where test time is minimized by applyingintensive stresses. AEC-Q100 is a typical acceleration test in automotive semiconductors, and it is designed to findvarious failures in semiconductors and to analyze their causes of occurance. So it finds many problems in design andfabrication as well as it predicts lifetime and reliability of semiconductors. AEC-Q100 consists of 7 test groups such asaccelerated environmental stress tests, accelerated lifetime simulation tests, package assembly integrity tests, diefabrication reliability tests, electrical verification tests, defect screening tests, and cavity package integrity tests. It has4 grades from grade 0 to grade 3 based on operational temperature. AEC-Q101, Q102, Q103, Q104, and Q200 are appliedto discrete semiconductors, optoelectronic semiconductors, sensors, multichip modules, and passive components, respectively.

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