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Continuous Height-restricted Solid-on-solid Model in Higher Dimensions
- Kim, Sang-Woo;
- Kim, Jin Min
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1초록
A continuous height-restricted solid-on-solid model is introduced to reduce the artifact of the discrete height model. The interface width W(t) grows as t(beta) at the beginning and becomes saturated with L-alpha for t >> L-z, where z is the dynamic exponent. Through a numerical simulation of the model, the growth exponent beta for dimension d = 4 + 1, 5 + 1, 6 + 1, and 7 + 1 and the roughness exponent alpha for d = 4 + 1 and 5 + 1 are obtained. They satisfy the scaling relation alpha + z = 2 very well for both d = 4+ 1 and d = 5 + 1. Our results show that the upper critical dimension of the Kardar-Parisi-Zhang equation is higher than d = 7 + 1.
키워드
Restricted solid-on-solid model; Surface roughness; growth exponent; Upper critical dimension; Kardar-Parisi-Zhang equation; PARISI-ZHANG EQUATION; DIRECTED POLYMERS
- 제목
- Continuous Height-restricted Solid-on-solid Model in Higher Dimensions
- 저자
- Kim, Sang-Woo; Kim, Jin Min
- 발행일
- 2014-12
- 유형
- Article
- 권
- 65
- 호
- 11
- 페이지
- 1729 ~ 1732
- 출판사
- KOREAN PHYSICAL SOC
- 발행국가
- 대한민국
- 분량
- 4 페이지
- ISSN
- E 1976-8524
P 0374-4884