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Spatially Coupled Codes via Partial and Recursive Superposition for Industrial IoT With High Trustworthiness
- Zhao, Shancheng;
- Wen, Jinming;
- Mumtaz, Shahid;
- Garg, Sahil;
- Choi, Bong Jun
WEB OF SCIENCE
13SCOPUS
20초록
For industrial Internet of Things (IIoT), data trustworthiness should be maintained both at the time of sensing and at the time of transmission. This article is concerned with trustworthiness during transmission, which is determined by transmission reliability. We present a low-complexity and flexible method via partial and recursive superposition to improve the transmission reliability of IIoT, resulting in an IIoT with high trustworthiness. In our method, a portion of the previously transmitted data are superimposed onto the current transmitted data to introduce memory among different transmissions, which are then exploited by the windowed decoder to obtain performance gain. The proposed method is referred to as partially recursive block Markov superposition transmission of low-density parity-check (PrBMST-LDPC) codes. This article is focused on the construction of low-complexity PrBMST-LDPC codes since IIoT is resource-limited in nature. The first construction is the memory-one PrBMST-LDPC code. We present a simplified density evolution algorithm to optimize the superposition ratio for memory-one PrBMST-LDPC code. Both the analytical and numerical results show that PrBMST with memory one can be used to reduce the packet loss ratio (PLR) of IIoT using LDPC codes. Particularly, around 1.0 dB performance gain is obtained by PrBMST. We then present a low-complexity construction for PrBMST-LDPC codes with encoding memory larger than one. Simulation results show that compared with memory-one PrBMST, a further PLR reduction of around one order of magnitude can be obtained.
키워드
- 제목
- Spatially Coupled Codes via Partial and Recursive Superposition for Industrial IoT With High Trustworthiness
- 저자
- Zhao, Shancheng; Wen, Jinming; Mumtaz, Shahid; Garg, Sahil; Choi, Bong Jun
- 발행일
- 2020-09
- 유형
- Article
- 권
- 16
- 호
- 9
- 페이지
- 6143 ~ 6153
- 언어
- ENG
- 출판사
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- 발행국가
- 미국
- 분량
- 11 페이지
- ISSN
- E 1941-0050
P 1551-3203