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Average current estimation technique for reliability analysis of multiple semiconductor interconnects
- Kim, K.-Y.;
- Lim, J.-H.;
- Kim, D.-M.;
- Kim, S.-Y.
Citations
SCOPUS
1초록
Average current analysis checking the impact of current flow is very important to guarantee the reliability of semiconductor systems. As semiconductor process technologies improve, the coupling capacitance often become bigger than self capacitances. In this paper, we propose an analytic technique for analyzing average current on interconnects in multi-conductor structures. The proposed technique has shown to yield the acceptable errors compared to HSPICE results while providing computational efficiency.
키워드
Current moment; Interconnect modeling; Reliability analysis; Worst-case switching
- 제목
- Average current estimation technique for reliability analysis of multiple semiconductor interconnects
- 저자
- Kim, K.-Y.; Lim, J.-H.; Kim, D.-M.; Kim, S.-Y.
- 발행일
- 2010
- 유형
- Article
- 권
- 71
- 페이지
- 465 ~ 469
- 분량
- 5 페이지
- ISSN
- E 2010-3778
P 2010-376X