The Development and Optimization of a Textile Image Processing Algorithm (TIPA) for Defect Detection in Conductive Textiles

초록

This study introduces a Textile Image Processing Algorithm (TIPA) designed to detect defects in conductive textiles, a crucial element of wearable technology. TIPAs employ image preprocessing, filtering, and classification to identify issues like uneven distribution of conductive particles. When applied to fabrics produced via dip-coating, our TIPA was optimized using a threshold ratio, achieving over 85% accuracy, with a maximum of 100% under ideal conditions. However, detection challenges were noted in fabrics with large, diffuse stains, particularly at extreme threshold ratios. This TIPA proves to be a valuable tool for improving quality control in smart textiles, with potential for further optimization.

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