A DEVICE-LIFE MODEL FOR RELIABILITY DEMONSTRATION TEST FOR A PRODUCT MADE UP OF A LARGE ARRAY OF ELECTRONIC DEVICES

초록

This study considers a reliability demonstration test to estimate a failuretime distribution of a product, which is made up of a large array of electronic devices, such as a display made up of pixel devices, a solar panel made up of photo-voltaic cells, and a semiconductor memory chip made up of memory cells. As a product ages, its devices encounter failures individually, and finally the product malfunctions when the number of failed devices exceeds a certain threshold. This study proposes a device-life model that estimates a product-failure distribution from device-failure observations. Product-failure time is extrapolated from a device-failure distribution. Because device failures are much more frequently observed than product failures, a test can be finished earlier than a conventional test observing product failures. The proposed model is illustrated by an example of a dark spot defect of OLED (organic light-emitting diode) displays. In this numerical study, it estimates a distribution that closely follows an empirical distribution.

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