Universal Route to Impart Orthogonality to Polymer Semiconductors for Sub-Micrometer Tandem Electronics

  • Park, H.W.; 
  • Choi, K.-Y.; 
  • Shin, J.; 
  • Kang, B.; 
  • Hwang, H.; 
  • ... Lee, H.; 
  • 외 12명
Citations

WEB OF SCIENCE

33
Citations

SCOPUS

34

초록

A universal method that enables utilization of conventional photolithography for processing a variety of polymer semiconductors is developed. The method relies on imparting chemical and physical orthogonality to a polymer film via formation of a semi-interpenetrating diphasic polymer network with a bridged polysilsesquioxane structure, which is termed an orthogonal polymer semiconductor gel. The synthesized gel films remain tolerant to various chemical and physical etching processes involved in photolithography, thereby facilitating fabrication of high-resolution patterns of polymer semiconductors. This method is utilized for fabricating tandem electronics, including pn-complementary inverter logic devices and pixelated polymer light-emitting diodes, which require deposition of multiple polymer semiconductors through solution processes. This novel and universal method is expected to significantly influence the development of advanced polymer electronics requiring sub-micrometer tandem structures. © 2019 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

키워드

orthogonal polymer semiconductor gel; photolithography; semi-interpenetrating diphasic polymer network; sequential solution processes; sub-micrometer tandem electronics; Etching; Logic devices; Micrometers; Organic light emitting diodes (OLED); Photolithography; Semiconducting films; Complementary inverters; Conventional photolithography; High-resolution patterns; Polymer light emitting diode; Polymer networks; Polymer semiconductors; Solution process; Submicrometers; Polymer films
제목
Universal Route to Impart Orthogonality to Polymer Semiconductors for Sub-Micrometer Tandem Electronics
저자
Park, H.W.; Choi, K.-Y.; Shin, J.; Kang, B.; Hwang, H.; Choi, S.; Song, A.; Kim, J.; Kweon, H.; Kim, S.; Chung, K.-B.; Kim, B.; Cho, K.; Kwon, S.-K.; Kim, Y.-H.; Kang, M.S.; Lee, H.; Kim, D.H.
DOI
10.1002/adma.201901400
발행일
2019-07
유형
Article
저널명
Advanced Materials
권
31
호
28
페이지
1901400