X-ray microdiffraction measurements with charge coupled detectors using tapered optical fiber coupling

초록

White-beam X-ray microdiffraction measurements use analyzed results of Lane images recorded by X-ray sensitive charge coupled detectors(CCD). If the accuracy of the measured lattice parameters is to be improved, the number of diffracted peaks needs to be increased by using a large CCD, but large area CCD chips are rare and expensive. An alternative is a CCD with tapered fiberoptic coupling. However, it introduces unwanted distortion of the Laue image, which degrades the quality of the measurements. In this study, a rountine was developed to correct the image distortion, and the errors in the strain measurements were estimated with and without the correction. As long as the distortion is smooth and less than 1 % of the CCD size, the distortion can be corrected by the routine up to an accuracy of 10(-5) in determining lattice parameters.

키워드